Test Infrastructure Design - Banerjee Anuja

Name: Test Infrastructure Design - Banerjee Anuja
Availability: OutOfStock

+ Dodaj do porównania Dodaj do listy zakupowej

Rozmiar

uniwersalny

524,82 zł

/ szt.

Najniższa cena z 30 dni przed obniżką: ~~552,83 zł~~ / szt.-5%

Cena regularna: ~~529,25 zł~~ / szt.-1%

Możesz kupić także poprzez:

Produkt niedostępny

Darmowa i szybka dostawa od 89,00 zł

14 dni na łatwy zwrot

Bezpieczne zakupy

Current-generation SOCs contain a heterogeneous mix of embedded cores, which include not only flat (non-hierarchical) digital modules, but also analog and hierarchical modules. The increase in SOC complexity has also been accompanied by the development of more versatile automatic test equipment (ATE). This book presents methods for modular test of heterogeneous SOCs, whereby test cost is reduced by combining effective test infrastructure design with efficient utilization of ATE resources. Test infrastructure design refers to the design and optimization of test wrappers and test access mechanisms, as well as test scheduling for efficient resource utilization.

EAN: 9783843373593

Kod produktu

304EXS03527KS

Autorzy

Banerjee Anuja

Rok wydania

2011

Elementy

188

Format

15.2x22.9cm

Język

angielski