Ridges in Image and Data Analysis - David Eberly
Ridges in Image and Data Analysis - David Eberly
AutorzyDavid Eberly
EAN: 9789048147618
Marka
Symbol
218HHQ03527KS
Rok wydania
2010
Strony
232
Oprawa
Miekka
Format
15.6x23.4cm
Język
angielski

Bez ryzyka
14 dni na łatwy zwrot

Szeroki asortyment
ponad milion pozycji

Niskie ceny i rabaty
nawet do 50% każdego dnia
Niepotwierdzona zakupem
Ocena: /5
Marka
Symbol
218HHQ03527KS
Kod producenta
9789048147618
Rok wydania
2010
Strony
232
Oprawa
Miekka
Format
15.6x23.4cm
Język
angielski
Autorzy
David Eberly

The concept of ridges has appeared numerous times in the image processing liter ature. Sometimes the term is used in an intuitive sense. Other times a concrete definition is provided. In almost all cases the concept
is used for very specific ap plications. When analyzing images or data sets, it is very natural for a scientist to measure critical behavior by considering maxima or minima of the data. These critical points are relatively
easy to compute. Numerical packages always provide support for root finding or optimization, whether it be through bisection, Newton's method, conjugate gradient method, or other standard methods. It has not been natural for
scientists to consider critical behavior in a higher-order sense. The con cept of ridge as a manifold of critical points is a natural extension of the concept of local maximum as an isolated critical point. However, almost no
attention has been given to formalizing the concept. There is a need for a formal development. There is a need for understanding the computation issues that arise in the imple mentations. The purpose of this book is to
address both needs by providing a formal mathematical foundation and a computational framework for ridges. The intended audience for this book includes anyone interested in exploring the use fulness of ridges in data analysis.
EAN: 9789048147618
EAN: 9789048147618
Niepotwierdzona zakupem
Ocena: /5
Zapytaj o produkt
Niepotwierdzona zakupem
Ocena: /5
Napisz swoją opinię